Kontamination von Oberflächen über die Luft. Sekundärionen-Flugzeitmassenspektrometrie: ein Verfahren zur exakten Charakterisierung geringster Verunreinigungen.

H. Feld, M. Deimel und J.-U. Riedel:
Metalloberfläche, 54(11) (2000) 48 - 52.

 

BESCHICHTUNGEN

Analyse der Rohstoffe, Zubereitungen und Beschichtungen – Analyseverfahren für Bindemittel.

R. Dietrich in Lehrbuch der Lacke und Beschichtungen, Band 10, 17-71, S. Hirzel Verlag Stuttgart (2006).

Fehlererkennung bei Beschichtungsprozessen

H. Feld, T.V. Phung, M. Deimel: Oberflächen Polysurfaces, 5/03 (2003) 13-17

Study of molecular surface diffusion by imaging static secondary ion mass spectrometry (SIMS): polymers on Ag-surfaces.

M. Deimel, H. Rulle, V. Liebig and A. Benninghoven:
Applied Surface Sciences, 134 (1998) 271 - 274.

Molecular Weight Determination of Bulk Polymer Surfaces by Static SIMS.

K. Reihs, K. Kircher, M. Voetz, M. Deimel, M. Petrat, D. Wolany, A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS X, p.641 - 644, John Wiley & Sons, Chichester 1997.

Correlation of Adhesion and Molecular Surface Structures of Technical Polymers.

K. Reihs, H. Rulle, M. Deimel, A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS X, p.715 - 718, John Wiley & Sons, Chichester 1997.

Investigation of the Surface Diffusion Behaviour of Polymers on Metal Surfaces Using Imaging TOF-SIMS.

M. Deimel, H. Rulle, and A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS X, p.755 - 758, John Wiley & Sons, Chichester 1997.

Temperature Programmed Static SIMS: Investigaton of Polymer Monolayers on Metal Surfaces.

M. Deimel, B. Hagenhoff, and A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS X, p.961 - 964, John Wiley & Sons, Chichester 1997.

Chemisorption of Poly(methylhydrogensiloxane) on Oxide Surfaces: a Quantitative Investigation Using Static SIMS

M. Deimel, K. Reihs, R. Aguiar Colom, S. Gleditzsch, B. Hagenhoff, A. Benninghoven:
J. o. Appl. Surf. Sci., 84(1) (1995) 107 - 118.

Analysis of SA-monolayers by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

M. Deimel, B. Hagenhoff, A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS IX, p.792 - 795, John Wiley & Sons, Chichester 1994.

Temperature Dependence of the Secondary Ion Emission from Molecular Surface Layers

M. Deimel, B. Hagenhoff, U.  Wolff, A. Benninghoven:
Second. Ion Mass Spectrom., SIMS IX, p.492-495, John Wiley & Sons, Chichester 1994.

Systematic Investigations of Secondary Ion Formation From Compact Polymer Materials: Polymethylmethacrylate and Polyethyleneglycol.

D. van Leyen, M. Deimel, B. Hagenhoff, and A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VIII, p.807 - 810; John Wiley & Sons, Chichester 1992.

High-Resolution TOF-SIMS Studies of Substituted Polystyrenes.

M. P. Chiarelli, A. Proctor, I. V. Bletsos, and D. M. Hercules;
H. Feld, A. Leute, and A. Benninghoven:
Macromolecules, 25 (1992) 6970 - 6976.

Surface Analysis by SIMS and PDMS. A Comparison for Polymers.

A. Leute, H. Feld, D. Rading, and A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VIII, p.589 - 592; John Wiley & Sons, Chichester 1992.

Systematic Investigation of Secondary Ion Formation from Compact Polymer Materials: Polymethylmetacrylat and Polyethylene Glycol

M. Deimel, D. van Leyen, B. Hagenhoff, A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VIII, p.807 - 810; John Wiley & Sons, Chichester 1992.

Comparative and Complementary Plasma Desorption Mass Spectrometry / Secondary Ion Mass Spectrometry Investigations of Polymer Materials.

H. Feld, A. Leute, R. Zurmühlen, and A. Benninghoven:
Analytical Chemistry, 63 (1991) 903 - 910.

Molecular Weight Distributions of Polymers Using Time-of-Flight Secondary-Ion Mass Spectrometry.

I. V. Bletsos and D. M. Hercules; D. van Leyen, B. Hagenhoff, E. Niehuis, and A. Benninghoven:
Analytical Chemistry, 63 (1991) 1953 - 1960.

Secondary Ion Emission From Polymer Materials Under keV-Ion And 252-Cf-Fission Fragment Bombardment.

H. Feld, R. Zurmühlen, A. Leute, B. Hagenhoff, and A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VII, p.219 - 222; John Wiley & Sons, Chichester 1990.

Secondary Ion Formation From Polymer Materials: A Systematic Investigation.

D. van Leyen, M. Deimel, B. Hagenhoff, and A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VII, p.757 - 760; John Wiley & Sons, Chichester 1990.

Structural Characterization of Model Polyester Polyurethanes Using Time - of - Flight Secondary Ion Mass Spectrometry.

I. V. Bletsos and D. M. Hercules; D. van Leyen and A. Benninghoven; C. G. Karakatsanis and J. N. Rieck:
Macromolecules, 23 (1990) 4157.

TOF-SIMS of Model Polyurethanes.

I. V. Bletsos and D. M. Hercules; J. N. Rieck and C. G. Karakatsanis; D. van Leyen and A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VII, p.765; John Wiley & Sons, Chichester 1990.

Formation of cationized species and fragmentation products from polystyrene under static secondary ion mass spectroscopy conditions.

J. Lub; D. van Leyen and A. Benninghoven:
Polymer Communications, 30 (1989) 74 - 77.

Recent Investigations In TOF-SIMS Of Polymer Materials.

B. Hagenhoff, D. van Leyen, H. Feld, and A. Benninghoven:
Ion Formation From Organic Solids (IFOS V), p.81 - 86;

 

Structural Characterization of Model Polyurethanes Using Time - of - Flight Secondary Ion Mass Spectrometry.

I. V. Bletsos and D. M. Hercules; D. van Leyen and A. Benninghoven; C. G. Karakatsanis and J. N. Rieck:
Analytical Chemistry, 61 (1989) 2124 - 2149.

The Time of Flight Static Secondary Negative Ion Mass Spectra of Poly(methylmethacrylate), Poly(ethylmethacrylate), and Poly(methylmethacrylate-co-ethylmethacrylate). Ion Structures and Quantification.

J. Lub and F. C. B. M. van Vroonhoven; D. van Leyen and A. Benninghoven:
Journal of Polymer Science: Part B: Polymer Physics, 27 (1989) 2071 - 2080.

Time-of-flight secondary ion mass spectrometry of polymer materials.

D. van Leyen, B. Hagenhoff, E. Niehuis, and A. Benninghoven; I. V. Bletsos and D. M. Hercules:
Journal of Vacuum Science & Technology, A7(3) (1989) 1790 - 1794.

 

Time-of-Flight Secondary Ion Mass Spectrometry: Detection of Fragments from Thick Polymer Films in the Range m/z £ 4500.

I. V. Bletsos and D. M. Hercules; J. H. Magill; D. van Leyen and A. Benninghoven:
Analytical Chemistry, 60 (1988) 938 - 944.

Static secondary ion mass spectrometry analysis of polycarbonate surfaces. Effect of structure and of surface modification on the spectra.

J. Lub and F. C. B. M. van Vroonhoven; D. van Leyen and A. Benninghoven:
Polymer, 29 (1988) 998 - 1003.

 

Time-of-Flight Secondary Ion Mass Spectrometry of Polymers in the Mass Range 500 - 10000.

I. V. Bletsos and D. M. Hercules; D. van Leyen and A. Benninghoven:
Macromolecules, 20 (1987) 407 - 413.
 

 

 

 

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Submonolayer detection of polymer additives at the surface of industrial products.

R. Dietrich:
Fresenius J. Anal. Chem., 361 (1998) 692 - 694.

Comparison of TOF-SIMS with laser desorption FT-ICR for Identification of Polymer Additives

M. Deimel, B. Asamoto, S.R. Bryan, C.L. Judy, R.W. Linton, B. Hagenhoff, A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VII, p.367 - 370, Wiley, John Wiley & Sons, Chichester 1990.
 

Secondary Ion Emission from Perfluorinated Polyethers under MeV- and keV-Ion Bombardment.

H. Feld, A. Leute, D. Rading, and A. Benninghoven; M. P. Chiarelli and D. M. Hercules:
Analytical Chemistry, 65 (1993) 1947 - 1953.

Quantitative Time - of - Flight Secondary Ion Mass Spectrometry of a Perfluorinated Polyether.

D. E. Fowler and R. D. Johnson; D. van Leyen and A. Benninghoven;
Surface and Interface Analysis, 17 (1991) 125.

Determination of Molecular Weight and Composition of a Perfluorinated Polymer from Fragment Intensities in Time - of - Flight Secondary Ion Mass Spectrometry.

D. E. Fowler and R. D. Johnson; D. van Leyen and A. Benninghoven:
Analytical Chemistry, 62 (1990) 2088.

 

Time - of - Flight Secondary Ion Mass Spectrometry of Perfluorinated Polyethers.

I. V. Bletsos and D. M. Hercules; D. Fowler; D. van Leyen and A. Benninghoven:
Analytical Chemistry, 62 (1990) 1275 - 1284.
 
 

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Surface Characterization of Particulate Video Tapes by Static SIMS.

P. N. T. van Velzen, P. E. Wierenga; R. C. F. Schaake; D. van Leyen and A. Benninghoven:
Tribology Transactions, 31(4) (1988) 489 - 496.
 

MIR FT - IR und TOF - SIMS in der Oberflächenanalytik

R. Dietrich, J. Grobe, K. Meyer, A. Benninghoven:
GIT Fachzeitschrift für das Laboratorium, 38 (1994) 925 - 933.
 

LACKE / LACKIERUNGEN / PULVERBESCHICHTUNGEN

Instrumente der Lackanalytik.

R. Dietrich, Verlag Vincentz, (2006), in Druck.

Entwicklung eines UV-härtenden Klarlacks für Kunststoffaußenbauteile.

J. Hellwig, Diplomarbeit, Münster (2003).

Krater im Lack. Lackierungsstörungen analysieren.

R. Dietrich:
Metalloberfläche, 53 (1999) 35 - 39.

Fehlern auf der Spur: Haftungs- und Benetzungsstörungen an lackierten Bauteilen

R. Dietrich:
Metalloberfläche, 49 (1995) 190 - 191.

Krater in Pulverbeschichtungen: Kleine Ursache, große Wirkung.

H. Feld:
Journal für Oberflächentechnik, 34 (1994) 70 - 76.

 

MESOSTRUKTURIERTE MATERIALIEN

 

Template-induced structural phase transition of GeS2 and GeSe2 in organic-inorganic hybrid mesostructures.

 

P.J. Klar, L.Chen, M. Güngerich, W. Heimbrodt, D. Kempe, N. Oberender and M. Fröba:
Physica, E13 (2002) 1259.

Novel nanostructures on the basis of GeS2- and GeSe2-MCM materials.

L. Chen, P.J. Klar, W. Heimbrodt, N. Oberender, De. Kempe and M. Fröba:
Springer Proceedings in Physics, 87 (2001) 1627.

First Synthesis of Mesostructured Hexagonal Germanium Sulfides Using Gemini Surfactants

N. Oberender, M. Fröba:
Stud. Surf. Sci. Catal., 129 (2000) 367.

Organic template directed growth of one- and two-dimensional GeX2/template superstructures (X=S, Se)

L. Chen, P.J. Klar, W. Heimbrodth, N. Oberender, D. Kempe, M. Fröba:
Appl. Phys.Lett., 77, 24 (2000) 3965.

New Synthetic Pathways to Mesostructured Thiogermanates

N. Oberender, M. Fröba: Mat. Res. Soc. Symp. Proc., 547 (1999) 433.

First Sythesis of Mesostructured Thiogermantes

M. Fröba, N. Oberender: Chem. Commun., (1997) 1729.

 

Quantification of Molecular SIMS by by Internal Standards

M. Deimel, B. Hagenhoff, R. Kock, H.J. Bauch, A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VIII, p.831 - 834, John Wiley & Sons, Chichester 1992.

D. van Leyen, D. Greifendorf, and A. Benninghoven:

Secondary Ion Mass Spectrometry, SIMS VI, p.679, John Wiley & Sons, Chichester 1987.

Analytical Application of a High Performance TOF-SIMS.

A. Benninghoven, E. Niehuis, D. Greifendorf, D. van Leyen and W. Lange:
Secondary Ion Mass Spectrometry SIMS V, p.497 - 499; Springer Series in Chemical Physics, Volume 44;

Springer, Berlin 1986.

 

 

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TOF-SIMS Analysis of the Surface of Insulators. Examples of Chemically Modified Polymers and Glass.

J. Lub and P. N. T. van Velzen; D. van Leyen, B. Hagenhoff and A. Benninghoven:
Surface and Interface Analysis, 12 (1988) 53 - 57.

TOXIKOLOGIE

Adsorption of mycotoxins.
N. Thimm, B. Schwaighofer, F. Ottner, H. Fröschl, S. Greifeneder, E.M. Binder:
Mycotoxin Research, 17A No 2 (2001) 219-223.

Adsorption of Mycotoxins - Characterisation of Specifity of Different Clays.
N. Thimm, G. Wei, F. Ottner, B. Schwaighofer, E.M. Binder:
Abstract Book IUPAC Symposium on Mycotoxins and Phycotoxins, Brasilien (2000) 82.

Mykotoxine in Österreich - Vorkommen, Effekte, Analytik, Gegenmaßnahmen.
N. Ellend:
Mycotoxins in food and feed, Proceedings (1998) Bydgoszcz, Polen. 95-100.

Mykotoxine in österreichischem Mais – eine Zweijahresübersicht.
N. Ellend, G. Galsterer, E.M. Binder:
Proceedings 20. Mykotoxin Workshop, Deutschland (1998) 126-130

Contamination of Austrian Corn with Fusarium Toxins in Autumn 1996.
N. Ellend, J. Binder, R. Krska, E.M Horvath:
Cereal Research Communications, 25, 3/1 (1997) 359-360.

Analytik mikrobieller Abbauprodukte von Desoxynivalenol.
N. Ellend, J. Binder, E. Schaffer, E.M. Horvath, R. Krska:
Proceedings 19. Mykotoxin Workshop Deutschland (1997) 55-59.

 

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Temperature Programmed TOF-SIMS: Investigaton of Si Wafer Surfaces.

M. Deimel, D. Rading, G. Egbers, E. Göcke, and A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS X, p.507 - 510, John Wiley & Sons, Chichester 1997

In-Situ FT-IR Studies of Porous Silicon Surface Reactions

R. Dietrich, H. Feld, J. Grobe:
J. Mol. Struct., 349, (1995), 109 - 112

Oberflächenuntersuchungen an Silylestermodifizierten Siliciumwafern.

R. Dietrich, J. Grobe, A. Benninghoven, B. Hagenhoff, K. Meier:
Organosilicon Chemistry VCH, (Ed. N. Auner, J. Weiss) (1994) 333

TOF-SIMS and FT-IR Investigations of Surface Modified Silicon Wafers-Porous Silicon

R. Dietrich, J. Grobe, K. Meyer, B. Hagenhoff, A. Benninghoven:
Fres. J. Anal. Chem., 349, (1994), 221 - 222

TOF-SIMS und IR-Spektroskopie in der Oberflächenanalytik chemisch modifizierter Siliciumwafer.

R. Dietrich, J. Grobe, A. Benninghoven, B. Hagenhoff, K. Meier:
Instrumentalized Analytical Chemistry and Computer Technology, Tagungsband InCom 1993.
 

 

Comparative Investigations of the Secondary Ion Emission of Metal Complexes under MeV- and keV-Ion Bombardment.

H. Feld, D. Rading, A. Leute, and A. Benninghoven:
Organic Mass Spectrometry, 28 (1993) 841 - 852.

High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni₆(SC₃H₇)₁₂].

H. Feld, D. Rading, A. Leute, and A. Benninghoven; G. Henkel, T. Krüger and B. Krebs:
Zeitschrift für Naturforschung, Section B - A Journal of Chemical Sciences, 47 (1992) 929 - 936.

Novel application of Static SIMS and PDMS to coordination compounds. Part I: Metal complexes with a small number of metal centers.

H. Feld, D. Rading, A. Leute, and A. Benninghoven; T. Krüger, G. Reusmann, and B. Krebs:
Secondary Ion Mass Spectrometry, SIMS VIII, p.25 - 28; John Wiley & Sons, Chichester 1992.

Novel application of Static SIMS and PDMS to coordination compounds. Part II: Ligand stabilized metal clusters.

H. Feld, D. Rading, A. Leute, and A. Benninghoven; G. Schmid:
Secondary Ion Mass Spectrometry, SIMS VIII, p.29 - 32; John Wiley & Sons, Chichester 1992.

Analysis of ionic metal complexes by time-of-flight secondary ion mass spectrometry and plasma desorption mass spectrometry.

H. Feld, A. Leute, D. Rading, and A. Benninghoven; G. Reusmann and B. Krebs:
International Journal of Mass Spectrometry and Ion Processes, 110 (1991) 225 - 235.

Formation of Very Large Gold Superclusters (Clusters of Clusters) as Secondary Ions up to (Au₁₃)₅₅ by Secondary Ion Mass Spectrometry.

H. Feld, A. Leute, D. Rading, and A. Benninghoven; G. Schmid:
Journal of the American Chemical Society, 112 (1990) 8166 - 8167.

Bericht über die Entdeckung von (Au₁₃)_n - Superclustern durch

H. Feld, A. Leute, D. Rading, A. Benninghoven, und G. Schmid:
Nachr. Chem. Tech. Lab., 38 (1990) 1034.

Secondary ion mass spectra of gold super clusters up to 140000 Dalton.

H. Feld, A. Leute, D. Rading, and A. Benninghoven; G. Schmid:
Zeitschrift für Physik D, 17 (1990) 73 - 76.
 

 

Carbon Cluster Emission from Polymers under Kiloelectronvolt and Megaelectronvolt Ion Bombardment.

H. Feld, R. Zurmühlen, A. Leute, and A. Benninghoven:
Journal of Physical Chemistry, 94 (1990) 4595 - 4599.

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Sensoren auf der Basis von Mikrostrukturen.

Erfinder: M. Knoll, H. Feld, S. Adam, und J. Eshold:
Deutsches Patentamt und Markenamt, DE 44 26 507 C2, Patenterteilung: 26.04.2001.

Verfahren zur Photoresistbeschichtung von mikromechanisch dreidimensional strukturierten Bauteilen in der Mikrostrukturtechnik sowie Vorrichtung zur Durchführung des Verfahrens.

Erfinder: H. Feld, C. Sundermeier, und M. Knoll:
Deutsches Patentamt und Markenamt, DE 42 28 344 C2, Patenterteilung: 10.06.1999.
 

 

Combined Instrument for the Online Investigation of Plasma-Deposited or Etched Surfaces by Monochromatized X-Ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry

M. Deimel, P.W. Jahn, F.M. Petrat, D. Wolany, T. Gantenfort, C. Schmerling, H. Wensing, L. Wiedmann, A. Benninghoven:
J. Vac. Sci. Technol., A (1994), 12 (3), 671 - 676.

A Combined MXPS/TOF-SIMS Instrument for the Investigation of Plasma-Deposited Polymeric Films

M. Deimel, P.W. Jahn, F.M. Petrat, C. Schmerling, D. Wolany, L. Wiedmann, A. Benninghoven:
Secondary Ion Mass Spectrometry, SIMS VIII, p.593 - 596, John Wiley & Sons, Chichester 1992.

Time-of-flight secondary ion mass spectrometry of insulators with pulsed charge compensation by low-energy electrons.

B. Hagenhoff, D. van Leyen, E. Niehuis, A. Benninghoven:
Journal of Vacuum Science & Technology, A7(5) (1989) 3056 - 3064.

Design and performance of a reflectron based time - of - flight secondary ion mass spectrometer with electrodynamic primary ion mass separation.

E. Niehuis, T. Heller, H. Feld, A. Benninghoven:
Journal of Vacuum Science & Technology, A5(4) (1987) 1243 - 1246.

A New High Resolution Time-Of-Flight Secondary Ion Mass Spectrometer.

E. Niehuis, T. Heller, H. Feld, and A. Benninghoven:
Abstr. 35th ASMS Conference on Mass Spectrometry and Allied Topics, p.296 - 297; Denver (Colorado) 1987.

High-Resolution TOF Secondary Ion Mass Spectrometer.

E. Niehuis, T. Heller, H. Feld, and A. Benninghoven:
Secondary Ion Mass Spectrometry SIMS V, p.188 - 190; Springer Series in Chemical Physics, Volume 44; Springer, Berlin 1986.

Development and performance of Time - Of - Flight Secondary Ion Mass Spectrometers. 

E. Niehuis, T. Heller, H. Feld, and A. Benninghoven:
Abstr. 34th ASMS Conference on Mass Spectrometry and Allied Topics, p.762 - 763; Cincinnati (Ohio) 1986.

High-Resolution TOF Secondary Ion Mass Spectrometer.

E. Niehuis, T. Heller, H. Feld, and A. Benninghoven:
Ion Formation from Organic Solids (IFOS III), p.198 - 202; Springer Proceedings in Physics, Volume 9; Springer, Berlin 1986.

Determination of selenite, selenate and selenmethionine by ion chromatography, microwave digestion and HGAAS.
N. Ellend, C. Rohrer, M. Grasserbauer, J.A.C. Broekaert:
Fresenius J Anal Chem 356 (1996) 99-101

Rapid Thin-Layer-Chromatographic Methods for the Determimnation of Microbiologoical Degradation Products of Deoxynivalenol.
N. Ellend, E.M. Horvath, J. Binder, R. Braun, R. Krska:
Cereal Research Communications, 25, 3/1 (1997) 361-362.

HPLC-MS-Method for A-Trichothecenes.
N. Thimm, J. Handl, E.M. Binder:
Mycotoxin Research, 17A No 2 (2001) 206-209.