OFG Analytik - surface thin film analysis wetting failure
OFG - Analytik
OFG Oberflächen - Festkörper - Grenzflächen Analytik GmbH

Certified according to ISO 9001

Analytical techniques

Analytical methods

FTIR microscope

List of analytical techniques

TOF-SIMS
(Time-of-Flight Secondary Ion Mass Spectrometry)

FTIR
(Fourier-Transform-Infrared Spectroscopy)

XPS, ESCA
(X-Ray Photoelectron Spectroscopy)

AES
(Auger-Electron-Spectroscopy)

SNMS
(Secondary Neutral Mass Spectrometry)

GDOES
(Glow Discharge Optical Emission Spectroscopy)

AFM
(Atomic Force Microscopy)

SEM / EDX
(Scanning Electron Microscopy with Energy Dispersive X-ray analysis)

TEM
(Transmission Electron Microscopy)

XRD
(X-Ray Diffraction)

Light Microscopy

Additional methods like Gas Chromatography (GC), Differential Scanning Calorimetry (DSC) ... for special questions

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