OFG Analytik - surface thin film analysis wetting failure
OFG - Analytik
OFG Oberflächen - Festkörper - Grenzflächen Analytik GmbH

Certified according to ISO 9001

Analytical informations

Analytical informations

cross section through multilayer coating (SEM image)

Which informations do the methods provide ?

Determination of the layer composition:

- layer thickness and layer composition (specially prepared cross sections)
- elemental composition as a function of layer depth (depth profiling)
- micro structure of single layers
- defect areas in coatings
- contaminations at layer interfaces
- ...

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Layer composition
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