{"id":3726,"date":"2024-03-15T13:13:34","date_gmt":"2024-03-15T12:13:34","guid":{"rendered":"https:\/\/www.ofg-analytik.de\/bibliography\/"},"modified":"2024-05-25T12:47:26","modified_gmt":"2024-05-25T10:47:26","slug":"bibliography","status":"publish","type":"page","link":"https:\/\/www.ofg-analytik.de\/en\/bibliography\/","title":{"rendered":"Bibliography"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"3726\" class=\"elementor elementor-3726 elementor-2277\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-fba591c elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"fba591c\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-ac43eeb\" data-id=\"ac43eeb\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-09600d0 elementor-widget elementor-widget-heading\" data-id=\"09600d0\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.22.0 - 24-06-2024 *\/\n.elementor-heading-title{padding:0;margin:0;line-height:1}.elementor-widget-heading .elementor-heading-title[class*=elementor-size-]>a{color:inherit;font-size:inherit;line-height:inherit}.elementor-widget-heading .elementor-heading-title.elementor-size-small{font-size:15px}.elementor-widget-heading .elementor-heading-title.elementor-size-medium{font-size:19px}.elementor-widget-heading .elementor-heading-title.elementor-size-large{font-size:29px}.elementor-widget-heading .elementor-heading-title.elementor-size-xl{font-size:39px}.elementor-widget-heading .elementor-heading-title.elementor-size-xxl{font-size:59px}<\/style><h1 class=\"elementor-heading-title elementor-size-default\">Bibliography<\/h1>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-ee72545 elementor-widget elementor-widget-text-editor\" data-id=\"ee72545\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.22.0 - 24-06-2024 *\/\n.elementor-widget-text-editor.elementor-drop-cap-view-stacked .elementor-drop-cap{background-color:#69727d;color:#fff}.elementor-widget-text-editor.elementor-drop-cap-view-framed .elementor-drop-cap{color:#69727d;border:3px solid;background-color:transparent}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap{margin-top:8px}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap-letter{width:1em;height:1em}.elementor-widget-text-editor .elementor-drop-cap{float:left;text-align:center;line-height:1;font-size:50px}.elementor-widget-text-editor .elementor-drop-cap-letter{display:inline-block}<\/style>\t\t\t\t<p><strong>Publications with the participation of OFG analytics staff <\/strong>(Status 2024)<\/p>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-4e0f86b elementor-widget__width-initial elementor-widget elementor-widget-text-editor\" data-id=\"4e0f86b\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<ul>\n<li>Dr. Herbert Feld<\/li>\n<li>Dr. Dieter van Leyen<\/li>\n<li>Dr. Roger Dietrich<\/li>\n<li>Dr. Markus Deimel<\/li>\n<li>Dr. T.V. Phung<\/li>\n<li>Dr. Nadine Oberender<\/li>\n<li>Dipl.-Ing. J\u00f6rn Hellwig<\/li>\n<li>Dipl.-Chem. U. Scholten<\/li>\n<li>Dr. S. Galla<\/li>\n<\/ul>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-13b651d elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"13b651d\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-f7592cd\" data-id=\"f7592cd\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-8ec8254 elementor-widget elementor-widget-heading\" data-id=\"8ec8254\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Subject areas<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-d1ce33d elementor-widget elementor-widget-accordion\" data-id=\"d1ce33d\" data-element_type=\"widget\" data-widget_type=\"accordion.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.22.0 - 24-06-2024 *\/\n.elementor-accordion{text-align:start}.elementor-accordion .elementor-accordion-item{border:1px solid #d5d8dc}.elementor-accordion .elementor-accordion-item+.elementor-accordion-item{border-top:none}.elementor-accordion .elementor-tab-title{margin:0;padding:15px 20px;font-weight:700;line-height:1;cursor:pointer;outline:none}.elementor-accordion .elementor-tab-title .elementor-accordion-icon{display:inline-block;width:1.5em}.elementor-accordion .elementor-tab-title .elementor-accordion-icon svg{width:1em;height:1em}.elementor-accordion .elementor-tab-title .elementor-accordion-icon.elementor-accordion-icon-right{float:right;text-align:right}.elementor-accordion .elementor-tab-title .elementor-accordion-icon.elementor-accordion-icon-left{float:left;text-align:left}.elementor-accordion .elementor-tab-title .elementor-accordion-icon .elementor-accordion-icon-closed{display:block}.elementor-accordion .elementor-tab-title .elementor-accordion-icon .elementor-accordion-icon-opened,.elementor-accordion .elementor-tab-title.elementor-active .elementor-accordion-icon-closed{display:none}.elementor-accordion .elementor-tab-title.elementor-active .elementor-accordion-icon-opened{display:block}.elementor-accordion .elementor-tab-content{display:none;padding:15px 20px;border-top:1px solid #d5d8dc}@media (max-width:767px){.elementor-accordion .elementor-tab-title{padding:12px 15px}.elementor-accordion .elementor-tab-title .elementor-accordion-icon{width:1.2em}.elementor-accordion .elementor-tab-content{padding:7px 15px}}.e-con-inner>.elementor-widget-accordion,.e-con>.elementor-widget-accordion{width:var(--container-widget-width);--flex-grow:var(--container-widget-flex-grow)}<\/style>\t\t<div class=\"elementor-accordion\">\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2191\" class=\"elementor-tab-title\" data-tab=\"1\" role=\"button\" aria-controls=\"elementor-tab-content-2191\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Areosol investigations<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2191\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"1\" role=\"region\" aria-labelledby=\"elementor-tab-title-2191\"><p><strong>Investigation of the Utility of Laser-Secondary Neutral Mass Spectrometry for the Detection of Polyaromatic Hydrocarbons in Individual Atmospheric Aerosol Particles<br \/><\/strong>B. J. Tyler, S. Dambach, <span style=\"text-decoration: underline;\">S. Galla<\/span> , R. E. Peterson, H. F. Arlinghaus: Analytical Chemistry, 84 (2012) 76 \u2013 82.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1021\/ac2008338\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/ac2008338<\/a><\/p>\n<p><strong>Kontamination von Oberfl\u00e4chen \u00fcber die Luft. Sekund\u00e4rionen\u2013Flugzeitmassenspektrometrie: ein Verfahren zur exakten Charakterisierung geringster Verunreinigungen<br \/><\/strong><span style=\"text-decoration: underline;\">H. Feld<\/span>, <span style=\"text-decoration: underline;\">M. Deimel<\/span> und J.\u2013U. Riedel: Metalloberfl\u00e4che, 54(11) (2000) 48 \u2013 52.<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2192\" class=\"elementor-tab-title\" data-tab=\"2\" role=\"button\" aria-controls=\"elementor-tab-content-2192\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Coatings<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2192\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"2\" role=\"region\" aria-labelledby=\"elementor-tab-title-2192\"><p><strong>Analyse der Rohstoffe, Zubereitungen und Beschichtungen \u2013 Analyseverfahren f\u00fcr Bindemittel<\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span> in: Lehrbuch der Lacke und Beschichtungen, Band 10, 17-71, S. Hirzel Verlag Stuttgart (2006).<\/p>\n<p><strong>Fault detection in coating processes<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, <span style=\"text-decoration: underline;\">T.V. Phung<\/span>, <span style=\"text-decoration: underline;\">M. Deimel<\/span>: Oberfl\u00e4chen Polysurfaces, 5\/03 (2003) 13-17.<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2193\" class=\"elementor-tab-title\" data-tab=\"3\" role=\"button\" aria-controls=\"elementor-tab-content-2193\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Plastics \/ polymers<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2193\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"3\" role=\"region\" aria-labelledby=\"elementor-tab-title-2193\"><p><strong>Study of molecular surface diffusion by imaging static secondary ion mass spectrometry (SIMS): polymers on Ag\u2013surfaces<\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, H. Rulle, V. Liebig and A. Benninghoven: Applied Surface Sciences, 134 (1998) 271 \u2013 274.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1016\/S0169-4332(98)00248-7\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1016\/S0169-4332(98)00248-7<\/a><\/p>\n<p><strong>Molecular Weight Determination of Bulk Polymer Surfaces by Static SIMS<\/strong><br \/>K. Reihs, K. Kircher, M. Voetz, <span style=\"text-decoration: underline;\">M. Deimel<\/span>, M. Petrat, D. Wolany, A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS X, p.641 \u2013 644, John Wiley &amp; Sons, Chichester 1997.<\/p>\n<p><strong>Correlation of Adhesion and Molecular Surface Structures of Technical Polymers<\/strong><br \/>K. Reihs, H. Rulle, <span style=\"text-decoration: underline;\">M. Deimel<\/span>, A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS X, p.715 \u2013 718, John Wiley &amp; Sons, Chichester 1997.<\/p>\n<p><strong>Investigation of the Surface Diffusion Behaviour of Polymers on Metal Surfaces Using Imaging TOF\u2013SIMS<\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, H. Rulle, and A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS X, p.755 \u2013 758, John Wiley &amp; Sons, Chichester 1997.<\/p>\n<p><strong>Temperature Programmed Static SIMS: Investigaton of Polymer Monolayers on Metal Surfaces<\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, B. Hagenhoff, and A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS X, p.961 \u2013 964, John Wiley &amp; Sons, Chichester 1997.<\/p>\n<p><strong>Chemisorption of Poly(methylhydrogensiloxane) on Oxide Surfaces: a Quantitative Investigation Using Static SIMS <\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, K. Reihs, R. Aguiar Colom, S. Gleditzsch, B. Hagenhoff, A. Benninghoven: J. o. Appl. Surf. Sci., 84(1) (1995) 107 \u2013 118.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1016\/0169-4332(94)00468-4\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1016\/0169-4332(94)00468-4<\/a><\/p>\n<p><strong>Temperaturprogrammierte Statische Sekund\u00e4rionen-Massenspektreometrie (TP-SIMS): Untersuchungen an Polymerlagen auf Metallsubstraten<\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, Dissertation, M\u00fcnster (1995)<\/p>\n<p><strong>Analysis of SA-monolayers by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)<\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, B. Hagenhoff, A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS IX, p.792 \u2013 795, John Wiley &amp; Sons, Chichester 1994.<\/p>\n<p><strong>Temperature Dependence of the Secondary Ion Emission from Molecular Surface Layers <\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, B. Hagenhoff, U. Wolff, A. Benninghoven: Second. Ion Mass Spectrom., SIMS IX, p.492-495, John Wiley &amp; Sons, Chichester 1994.<\/p>\n<p><strong>Systematische Untersuchung zur Sekund\u00e4rionenemission synthetischer Polymere<\/strong><br \/><span style=\"text-decoration: underline;\">D. van Leyen<\/span>, Dissertation, M\u00fcnster (1993)<\/p>\n<p><strong>High\u2013Resolution TOF-SIMS Studies of Substituted Polystyrenes<\/strong><br \/>M. P. Chiarelli, A. Proctor, I. V. Bletsos, and D. M. Hercules; <span style=\"text-decoration: underline;\">H. Feld<\/span>, A. Leute, and A. Benninghoven: Macromolecules, 25 (1992) 6970 \u2013 6976.<br \/><a href=\"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ma00051a038\" target=\"_blank\" rel=\"noopener\">https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ma00051a038<\/a><\/p>\n<p class=\"p1\"><strong>Systematic Investigations of Secondary Ion Formation From Compact Polymer Materials: <span class=\"s1\">Polymethylmethacrylate and Polyethyleneglycol.<br \/><\/span><\/strong><span style=\"text-decoration: underline;\"><span class=\"s1\">D.<\/span> <span class=\"s1\">van Leyen<\/span><\/span><span class=\"s3\">, <\/span><span style=\"text-decoration: underline;\"><span class=\"s1\">M. Deimel<\/span><\/span>, B. Hagenhoff, and A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VIII, p.807 \u2013 810; John Wiley &amp; Sons, Chichester 1992.<\/p>\n<p><strong>Surface Analysis by SIMS and PDMS. A Comparison for Polymers<\/strong><br \/>A. Leute, <span style=\"text-decoration: underline;\">H. Feld<\/span>, D. Rading, and A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VIII, p.589 \u2013 592; John Wiley &amp; Sons, Chichester 1992.<\/p>\n<p><strong>Systematic Investigation of Secondary Ion Formation from Compact Polymer Materials: Polymethylmetacrylat and Polyethylene Glycol<\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, <span style=\"text-decoration: underline;\">D. van Leyen<\/span>, B. Hagenhoff, A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VIII, p.807 \u2013 810; John Wiley &amp; Sons, Chichester 1992.<\/p>\n<p><strong>Comparative and Complementary Plasma Desorption Mass Spectrometry \/ Secondary Ion Mass Spectrometry Investigations of Polymer Materials<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, A. Leute, R. Zurm\u00fchlen and A. Benninghoven: Analytical Chemistry, 63 (1991) 903 \u2013 910.<br \/><a href=\"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ac00009a013\" target=\"_blank\" rel=\"noopener\">https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ac00009a013<\/a><\/p>\n<p><strong>Molecular Weight Distributions of Polymers Using Time\u2013of\u2013Flight Secondary\u2013Ion Mass Spectrometry<\/strong><br \/>I. V. Bletsos and D. M. Hercules; <span style=\"text-decoration: underline;\">D. van Leyen<\/span>, B. Hagenhoff, E. Niehuis, and A. Benninghoven: Analytical Chemistry, 63 (1991) 1953 \u2013 1960.<br \/><a href=\"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ac00018a011\" target=\"_blank\" rel=\"noopener\">https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ac00018a011<\/a><\/p>\n<p><strong>Secondary Ion Emission From Polymer Materials Under keV-Ion And 252-Cf-Fission Fragment Bombardment <\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, R. Zurm\u00fchlen, A. Leute, B. Hagenhoff, and A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VII, p.219 \u2013 222; John Wiley &amp; Sons, Chichester 1990.<\/p>\n<p><strong>Secondary Ion Formation From Polymer Materials: A Systematic Investigation<\/strong><br \/><span style=\"text-decoration: underline;\">D. van Leyen<\/span>, <span style=\"text-decoration: underline;\">M. Deimel<\/span>, B. Hagenhoff, and A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VII, p.757 \u2013 760; John Wiley &amp; Sons, Chichester 1990.<\/p>\n<p><strong>Structural Characterization of Model Polyester Polyurethanes Using Time \u2013 of \u2013 Flight Secondary Ion Mass Spectrometry <\/strong><br \/>I. V. Bletsos and D. M. Hercules; <span style=\"text-decoration: underline;\">D. van Leyen<\/span> and A. Benninghoven; C. G. Karakatsanis and J. N. Rieck: Macromolecules, 23 (1990) 4157.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1021\/ma00220a020\" target=\"_blank\" rel=\"noopener\"><span class=\"s1\">https:\/\/doi.org\/10.1021\/ma00220a020<\/span><\/a><\/p>\n<p><strong>TOF\u2013SIMS of Model Polyurethanes<\/strong><br \/>I. V. Bletsos and D. M. Hercules; J. N. Rieck and C. G. Karakatsanis; <span style=\"text-decoration: underline;\">D. van Leyen<\/span> and A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VII, p.765; John Wiley &amp; Sons, Chichester 1990.<\/p>\n<p><strong>Messungen an einem Detektor zur Bestimmung von Nachweiswahrscheinlichkeiten hochmolekularer Polymerionen<\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, Diplomarbeit, M\u00fcnster (1989)<\/p>\n<p><strong>Formation of cationized species and fragmentation products from polystyrene under static secondary ion mass spectroscopy conditions<\/strong><br \/>J. Lub; <span style=\"text-decoration: underline;\">D. van Leyen<\/span> and A. Benninghoven: Polymer Communications, 30 (1989) 74 \u2013 77.<\/p>\n<p><strong>Recent Investigations In TOF-SIMS Of Polymer Materials <\/strong><br \/>B. Hagenhoff, <span style=\"text-decoration: underline;\">D. van Leyen<\/span>, <span style=\"text-decoration: underline;\">H. Feld<\/span>, and A. Benninghoven: Ion Formation From Organic Solids (IFOS V), p.81 \u2013 86.<\/p>\n<p><strong>Structural Characterization of Model Polyurethanes Using Time \u2013 of \u2013 Flight Secondary Ion Mass Spectrometry <\/strong><br \/>I. V. Bletsos and D. M. Hercules; <span style=\"text-decoration: underline;\">D. van Leyen<\/span> and A. Benninghoven; C. G. Karakatsanis and J. N. Rieck: Analytical Chemistry, 61 (1989) 2124 \u2013 2149.<br \/><a href=\"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ac00194a006\" target=\"_blank\" rel=\"noopener\">https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ac00194a006<\/a><\/p>\n<p><strong>The Time of Flight Static Secondary Negative Ion Mass Spectra of Poly(methylmethacrylate), Poly- (ethylmethacrylate), and Poly(methylmethacrylate-co-ethylmethacrylate) Ion Structures and Quantification.<\/strong><br \/>J. Lub and F. C. B. M. van Vroonhoven; <span style=\"text-decoration: underline;\">D. van Leyen<\/span> and A. Benninghoven: Journal of Polymer Science: Part B: Polymer Physics, 27 (1989) 2071 \u2013 2080.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1002\/polb.1989.090271011\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1002\/polb.1989.090271011<\/a><\/p>\n<p><strong>Time-of-flight secondary ion mass spectrometry of polymer materials <\/strong><br \/>D. van Leyen, B. Hagenhoff, E. Niehuis, and A. Benninghoven; I. V. Bletsos and D. M. Hercules: Journal of Vacuum Science &amp; Technology, A7(3) (1989) 1790 \u2013 1794.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1116\/1.576047\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1116\/1.576047<\/a><\/p>\n<p><strong>Time-of-Flight Secondary Ion Mass Spectrometry: Detection of Fragments from Thick Polymer Films in the Range m\/z \u2264 4500 <\/strong><br \/>I. V. Bletsos and D. M. Hercules; J. H. Magill; D. van Leyen and A. Benninghoven: Analytical Chemistry, 60 (1988) 938 \u2013 944.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1021\/AC00160A021\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/AC00160A021<\/a><\/p>\n<p><strong>Static secondary ion mass spectrometry analysis of polycarbonate surfaces \u2013 Effect of structure and of surface modification on the spectra<br \/><\/strong>J. Lub and F. C. B. M. van Vroonhoven; D. van Leyen and A. Benninghoven: Polymer, 29 (1988) 998 \u2013 1003.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1016\/0032-3861(88)90006-7\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1016\/0032-3861(88)90006-7<\/a><\/p>\n<p><strong>Time-of-Flight Secondary Ion Mass Spectrometry of Polymers in the Mass Range 500 \u2013 10000<\/strong><br \/>I. V. Bletsos and D. M. Hercules; D. van Leyen and A. Benninghoven: Macromolecules, 20 (1987) 407 \u2013 413.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1021\/ma00168a030\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/ma00168a030<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2194\" class=\"elementor-tab-title\" data-tab=\"4\" role=\"button\" aria-controls=\"elementor-tab-content-2194\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Additives in plastics \/ polymers<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2194\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"4\" role=\"region\" aria-labelledby=\"elementor-tab-title-2194\"><p><strong>Submonolayer detection of polymer additives at the surface of industrial products <\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>: Fresenius J. Anal. Chem., 361 (1998) 692 \u2013 694.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1007\/s002160050995\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1007\/s002160050995<\/a><\/p>\n<p><strong>Comparison of TOF-SIMS with laser desorption FT-ICR for Identification of Polymer Additives <\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, B. Asamoto, S.R. Bryan, C.L. Judy, R.W. Linton, B. Hagenhoff, A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VII, p.367 \u2013 370, Wiley, John Wiley &amp; Sons, Chichester 1990.<\/p>\n<p class=\"p1\"><strong>Secondary Ion Emission from Perfluorinated Polyethers <\/strong><strong>under MeV- and keV-Ion Bombardment.<br \/><\/strong><span style=\"text-decoration: underline;\">H. Feld<\/span><span class=\"s1\">, A. <\/span>Leute, D. Rading, and A. Benninghoven; M. P. Chiarelli and D. M. Hercules: Analytical Chemistry, 65 (1993) 1947 \u2013 1953.<br \/>DOI: <a href=\"https:\/\/pubs.acs.org\/doi\/abs\/10.1021\/ac00063a005\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/ac00063a005<\/a><\/p>\n<p class=\"p1\"><strong>Quantitative Time \u2013 of \u2013 Flight Secondary Ion Mass <span class=\"s1\">Spectrometry of a Perfluorinated Polyether.<br \/><\/span><\/strong>Fowler and R. D. Johnson; <span style=\"text-decoration: underline;\"><span class=\"s1\">D. van Leyen<\/span><\/span> and A. Benninghoven: Surface and Interface Analysis, 17 (1991) 125.<br \/>DOI: <a href=\"https:\/\/analyticalsciencejournals.onlinelibrary.wiley.com\/doi\/10.1002\/sia.740170303\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1002\/sia.740170303<\/a><\/p>\n<p class=\"p1\"><strong>Determination of Molecular Weight and Composition of a Perfluorinated Polymer from Fragment Intensities <span class=\"s1\">in Time \u2013 of \u2013 Flight Secondary Ion Mass Spectrometry.<br \/><\/span><\/strong>D. E. Fowler and R. D. Johnson; <span style=\"text-decoration: underline;\"><span class=\"s1\">D.<\/span> <span class=\"s1\">van Leyen<\/span><\/span> and A. Benninghoven: Analytical Chemistry, 62 (1990) 2088.<br \/>DOI: <a href=\"https:\/\/pubs.acs.org\/doi\/abs\/10.1021\/ac00218a008\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/ac00218a008<\/a><\/p>\n<p class=\"p1\"><strong>Time \u2013 of \u2013 Flight Secondary Ion Mass Spectrometry of Perfluorinated Polyethers.<br \/><\/strong>Hercules; D. Fowler; <span style=\"text-decoration: underline;\"><span class=\"s1\">D. van Leyen<\/span><\/span> and A. Benninghoven: <span class=\"s3\">Analytical Chemistry, 62 (1990) 1275 \u2013 1284.<br \/><\/span>DOI: <a href=\"https:\/\/pubs.acs.org\/doi\/abs\/10.1021\/ac00212a015\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/ac00212a015<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2195\" class=\"elementor-tab-title\" data-tab=\"5\" role=\"button\" aria-controls=\"elementor-tab-content-2195\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Lubricants \/ Perfluorinated polyethers<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2195\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"5\" role=\"region\" aria-labelledby=\"elementor-tab-title-2195\"><p><strong>Mise en evidence et identification des pellicules de<\/strong><br \/><strong>lubrifiant dans les analyses de d\u00e9fauts et de<\/strong><br \/><strong>dommages: l\u2019huile de base et les additifs (1\/2).<br \/><\/strong><span style=\"text-decoration: underline;\">H. Feld<\/span>, <span style=\"text-decoration: underline;\">N. Oberender<\/span>, <span style=\"text-decoration: underline;\">J. Hellwig<\/span>: Oberfl\u00e4chen POLYSURFACES,<br \/>5-6 (2022), 13-17.<\/p>\n<p><strong>Les substances protectrices contre la rouille de contact<\/strong><br \/><strong>sur les transmetteurs \u00e0bague collectrice (2\/2).<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, <span style=\"text-decoration: underline;\">N. Oberender<\/span>, <span style=\"text-decoration: underline;\">J. Hellwig<\/span>: Oberfl\u00e4chen POLYSURFACES, 1 (2023), 34-36.<\/p>\n<p><strong>Kollateralsch\u00e4den durch falsche Schmierstoffe.<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, <span style=\"text-decoration: underline;\">N. Oberender<\/span>, <span style=\"text-decoration: underline;\">J. Hellwig<\/span>: mo Magazin f\u00fcr<br \/>Oberfl\u00e4chentechnik, 76 (2022) (9) 52 \u2013 56.<br \/><a href=\"http:\/\/www.oberflaeche.de\" target=\"_blank\" rel=\"noopener\">www.oberflaeche.de<\/a><\/p>\n<p><strong>Nachweis und Identifizierung von Schmierstoffbel\u00e4gen<\/strong><br \/><strong>in der Fehler- und Schadensanalytik (1\/2).<\/strong><br \/><span style=\"text-decoration: underline;\">H.Feld<\/span>, <span style=\"text-decoration: underline;\">N. Oberender<\/span>, <span style=\"text-decoration: underline;\">J. Hellwig<\/span>: Oberfl\u00e4chen Polysurfaces, 3 (2022) 13 \u2013 17.<\/p>\n<p><strong>Kontaktschutz\u00f6l auf Schleifring\u00fcbertr\u00e4gern (Teil 2).<\/strong><br \/><span style=\"text-decoration: underline;\">H.Feld<\/span>, <span style=\"text-decoration: underline;\">N. Oberender<\/span>, <span style=\"text-decoration: underline;\">J. Hellwig<\/span>: Oberfl\u00e4chen Polysurfaces, 4 (2022) 18 \u2013 20.<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2196\" class=\"elementor-tab-title\" data-tab=\"6\" role=\"button\" aria-controls=\"elementor-tab-content-2196\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Polyaromatic hydrocarbons<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2196\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"6\" role=\"region\" aria-labelledby=\"elementor-tab-title-2196\"><p><strong>Laser-SNMS Investigations on Pyrene using Ga+, Bi1+, Bi3+ and Bi5+ as Primary Ions, and Different Laser Wavelengths and Laser Power Densities for Photoionization<br \/><\/strong><span style=\"text-decoration: underline;\">S. Galla<\/span>, A. Pelster, F. Draude, H. F. Arlinghaus : Surface and Interface Analysis; 45(1), 31\u201334, (2013).<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1002\/sia.4962\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1002\/sia.4962<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2197\" class=\"elementor-tab-title\" data-tab=\"7\" role=\"button\" aria-controls=\"elementor-tab-content-2197\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Paints \/ lacquers \/ powder coatings<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2197\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"7\" role=\"region\" aria-labelledby=\"elementor-tab-title-2197\"><p><strong>Surface analysis. Knowledge versus risk. \u2013 Part 2. <br \/><\/strong><span style=\"text-decoration: underline;\">R. Dietrich<\/span>: European Coatings Jounal, (07\/08) (2009) 34 \u2013 37.<\/p>\n<p><strong>Surface analysis. Knowledge versus risk. \u2013 Part 1. <br \/><\/strong><span style=\"text-decoration: underline;\">R. Dietrich<\/span>: European Coatings Jounal, (04) (2009) 126-131.<\/p>\n<p><strong>Buch: Paint Analysis<\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>: Vincentz Network, (2009)<\/p>\n<p><strong>Buch: Instrumentelle Lackanalytik <\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>: Verlag Vincentz, (2006)<\/p>\n<p><strong>Entwicklung eines UV-h\u00e4rtenden Klarlacks f\u00fcr Kunststoffau\u00dfenbauteile<\/strong><br \/><span style=\"text-decoration: underline;\">J. Hellwig<\/span>: Diplomarbeit, M\u00fcnster (2003)<\/p>\n<p><strong>Krater im Lack \u2013 Lackierungsst\u00f6rungen analysieren<\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>: Metalloberfl\u00e4che, 53 (1999) 35 \u2013 39.<\/p>\n<p><strong>Fehlern auf der Spur: Haftungs- und Benetzungsst\u00f6rungen an lackierten Bauteilen<\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>: Metalloberfl\u00e4che, 49 (1995) 190 \u2013 191.<\/p>\n<p><strong>Krater in Pulverbeschichtungen: Kleine Ursache, gro\u00dfe Wirkung<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>: Journal f\u00fcr Oberfl\u00e4chentechnik, 34 (1994) 70 \u2013 76.<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2198\" class=\"elementor-tab-title\" data-tab=\"8\" role=\"button\" aria-controls=\"elementor-tab-content-2198\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Peptides \/ amino acids<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2198\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"8\" role=\"region\" aria-labelledby=\"elementor-tab-title-2198\"><p><strong>Quantification of Molecular SIMS by Internal Standards <\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, B. Hagenhoff, R. Kock, H.J. Bauch, A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VIII, p.831 \u2013 834, John Wiley &amp; Sons, Chichester 1992.<\/p>\n<p><strong>Secondary Ion Mass Spectrometry<\/strong><br \/><span style=\"text-decoration: underline;\">D. van Leyen<\/span>, D. Greifendorf, and A. Benninghoven, SIMS VI, p.679, John Wiley &amp; Sons, Chichester 1987.<\/p>\n<p><strong>Analytical Application of a High Performance TOF\u2013SIMS <\/strong><br \/>A. Benninghoven, E. Niehuis, D. Greifendorf, <span style=\"text-decoration: underline;\">D. van Leyen<\/span> and W. Lange: Secondary Ion Mass Spectrometry SIMS V, p.497 \u2013 499; Springer Series in Chemical Physics, Volume 44; Springer, Berlin 1986.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1007\/978-3-642-82724-2_131\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1007\/978-3-642-82724-2_131<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-2199\" class=\"elementor-tab-title\" data-tab=\"9\" role=\"button\" aria-controls=\"elementor-tab-content-2199\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Mesostructured materials<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-2199\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"9\" role=\"region\" aria-labelledby=\"elementor-tab-title-2199\"><p><strong>Template-induced structural phase transition of GeS2 and GeSe2 in organic-inorganic hybrid mesostructures<\/strong><br \/>P.J. Klar, L. Chen, M. G\u00fcngerich, W. Heimbrodt, D. Kempe, <span style=\"text-decoration: underline;\">N. Oberender<\/span> and M. Fr\u00f6ba: Physica, E13 (2002) 1259.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1016\/S1386-9477(02)00349-1\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1016\/S1386-9477(02)00349-1<\/a><\/p>\n<p><strong>Novel nanostructures on the basis of GeS2- and GeSe2-MCM materials <\/strong><br \/>L. Chen, P.J. Klar, W. Heimbrodt, <span style=\"text-decoration: underline;\">N. Oberender<\/span> , De. Kempe and M. Fr\u00f6ba: Springer Proceedings in Physics, 87 (2001) 1627.<\/p>\n<p><strong>First Synthesis of Mesostructured Hexagonal Germanium Sulfides Using Gemini Surfactants <\/strong><br \/><span style=\"text-decoration: underline;\">N. Oberender<\/span>, M. Fr\u00f6ba: Stud. Surf. Sci. Catal., 129 (2000) 367.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1016\/S0167-2991(00)80235-9\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1016\/S0167-2991(00)80235-9<\/a><\/p>\n<p><strong>Organic template directed growth of one- and two-dimensional GeX2\/template superstructures<br \/>(X=S, Se)<\/strong><br \/>L. Chen, P.J. Klar, W. Heimbrodth, <span style=\"text-decoration: underline;\">N. Oberender<\/span>, De. Kempe, M. Fr\u00f6ba: Appl. Phys.Lett., 77, 24 (2000) 3965.<br \/>DOI: <a href=\"https:\/\/pubs.aip.org\/aip\/apl\/article-abstract\/77\/24\/3965\/517491\/Organic-template-directed-growth-of-one-and-two?redirectedFrom=fulltext\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1063\/1.1333688<\/a><\/p>\n<p><strong>New Synthetic Pathways to Mesostructured Thiogermanates <\/strong><br \/><span style=\"text-decoration: underline;\">N. Oberender<\/span>, M. Fr\u00f6ba: Mat. Res. Soc. Symp. Proc., 547 (1999) 433.<br \/>DOI: <a href=\"https:\/\/link.springer.com\/article\/10.1557\/PROC-547-433\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1557\/PROC-547-433<\/a><\/p>\n<p><strong>First Sythesis of Mesostructured Thiogermantes <\/strong><br \/>M. Fr\u00f6ba, <span style=\"text-decoration: underline;\">N. Oberender<\/span>: Chem. Commun., (1997) 1729.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1039\/A703634E\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1039\/A703634E<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21910\" class=\"elementor-tab-title\" data-tab=\"10\" role=\"button\" aria-controls=\"elementor-tab-content-21910\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Adhesion promoter<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21910\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"10\" role=\"region\" aria-labelledby=\"elementor-tab-title-21910\"><p><strong>MIR FT \u2013 IR und TOF \u2013 SIMS in der Oberfl\u00e4chenanalytik <\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>, J. Grobe, K. Meyer, A. Benninghoven: GIT Fachzeitschrift f\u00fcr das Laboratorium, 38 (1994)<br \/>925 \u2013 933.<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21911\" class=\"elementor-tab-title\" data-tab=\"11\" role=\"button\" aria-controls=\"elementor-tab-content-21911\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Tribology<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21911\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"11\" role=\"region\" aria-labelledby=\"elementor-tab-title-21911\"><p><strong>Surface Characterization of Particulate Video Tapes by Static SIMS <\/strong><br \/>P. N. T. van Velzen, P. E. Wierenga; R. C. F. Schaake; <span style=\"text-decoration: underline;\">D. van Leyen<\/span> and A. Benninghoven: Tribology Transactions, 31(4) (1988) 489 \u2013 496.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1080\/10402008808981853\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1080\/10402008808981853<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21912\" class=\"elementor-tab-title\" data-tab=\"12\" role=\"button\" aria-controls=\"elementor-tab-content-21912\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Insulators<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21912\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"12\" role=\"region\" aria-labelledby=\"elementor-tab-title-21912\"><p><strong>TOF-SIMS Analysis of the Surface of Insulators. Examples of Chemically Modified Polymers<br \/>and Glass<\/strong><br \/>J. Lub and P. N. T. van Velzen; <span style=\"text-decoration: underline;\">D. van Leyen<\/span>, B. Hagenhoff and A. Benninghoven: Surface and Interface Analysis, 12 (1988) 53 \u2013 57.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1002\/sia.740120112\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1002\/sia.740120112<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21913\" class=\"elementor-tab-title\" data-tab=\"13\" role=\"button\" aria-controls=\"elementor-tab-content-21913\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Electronics \/ Electrical engineering<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21913\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"13\" role=\"region\" aria-labelledby=\"elementor-tab-title-21913\"><p><strong>Fogging im Innenraum von Elektromotoren und \u2013generatoren<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>: Elektronikpraxis, 6 (2015) 62 \u2013 65.<\/p>\n<p><strong>Fogging bei Kommutatoren und B\u00fcrsten in Elektromotoren<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>: Elektronikpraxis, 11 (2014) 84 \u2013 88.<br \/><a href=\"https:\/\/www.elektronikpraxis.de\/fogging-bei-kommutatoren-und-buersten-in-elektromotoren-a-464544\/\" target=\"_blank\" rel=\"noopener\">https:\/\/www.elektronikpraxis.de\/fogging-bei-kommutatoren-und-buersten-in-elektromotoren-a-464544\/<\/a><\/p>\n<p><strong>20 Ursachen, warum Relais ausfallen k\u00f6nnen, Teil 2<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, <span style=\"text-decoration: underline;\">M. Deimel<\/span> und <span style=\"text-decoration: underline;\">U.Scholten<\/span>, Elektronikpraxis, 18 (2011) 66 \u2013 70.<br \/><a href=\"https:\/\/www.elektronikpraxis.de\/20-ursachen-warum-relais-ausfallen-koennen-teil-2-a-8d641778ff2602fa67f950fc08eb2cf1\/\" target=\"_blank\" rel=\"noopener\">https:\/\/www.elektronikpraxis.de\/20-ursachen-warum-relais-ausfallen-koennen-teil-2-a-8d641778ff2602fa67f950fc08eb2cf1\/<\/a><\/p>\n<p><strong>20 Ursachen, warum Relais ausfallen k\u00f6nnen, Teil 1<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, <span style=\"text-decoration: underline;\">M. Deimel<\/span> und <span style=\"text-decoration: underline;\">U.Scholten<\/span>, Elektronikpraxis, 11 (2011) 44 \u2013 46.<br \/><a href=\"https:\/\/www.elektronikpraxis.de\/20-ursachen-warum-relais-ausfallen-koennen-a-318888\/\" target=\"_blank\" rel=\"noopener\">https:\/\/www.elektronikpraxis.de\/20-ursachen-warum-relais-ausfallen-koennen-a-318888\/<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21914\" class=\"elementor-tab-title\" data-tab=\"14\" role=\"button\" aria-controls=\"elementor-tab-content-21914\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Energy and fuels<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21914\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"14\" role=\"region\" aria-labelledby=\"elementor-tab-title-21914\"><p><strong>Characterization of Damaging Biodiesel Depostis and Biodiesel Samples by Infrared Spectroscopy (ATR-FTIR) and Mass Spectrometry<br \/><\/strong><span style=\"text-decoration: underline;\">H. Feld<\/span> and <span style=\"text-decoration: underline;\">N. Oberender<\/span>: SAE Int. J. Fuels Lubr. 9(3):2016, DOI: <a href=\"https:\/\/doi.org\/10.4271\/2016-01-9078\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.4271\/2016-01-9078<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21915\" class=\"elementor-tab-title\" data-tab=\"15\" role=\"button\" aria-controls=\"elementor-tab-content-21915\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Silicon wafers<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21915\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"15\" role=\"region\" aria-labelledby=\"elementor-tab-title-21915\"><p><strong>Temperature Programmed TOF\u2013SIMS: Investigaton of Si Wafer Surfaces <\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, D. Rading, G. Egbers, E. G\u00f6cke, and A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS X, p.507 \u2013 510, John Wiley &amp; Sons, Chichester 1997<\/p>\n<p><strong>Chemische Funktionalisierung von Silicium-Halbleiteroberfl\u00e4chen<\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>, Dissertation, M\u00fcnster (1995)<\/p>\n<p><strong>Oberfl\u00e4chenuntersuchungen an Silylestermodifizierten Siliciumwafern <\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>, J. Grobe, A. Benninghoven, B. Hagenhoff, K. Meier: Organosilicon Chemistry VCH, (Ed. N. Auner, J. Weiss) (1994) 333<\/p>\n<p><strong>TOF-SIMS and FT-IR Investigations of Surface Modified Silicon Wafers-Porous Silicon <\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>, J. Grobe, K. Meyer, B. Hagenhoff, A. Benninghoven: Fres. J. Anal. Chem., 349, (1994), 221 \u2013 222<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1007\/BF00323283\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1007\/BF00323283<\/a><\/p>\n<p><strong>TOF\u2013SIMS und IR\u2013Spektroskopie in der Oberfl\u00e4chenanalytik chemisch modifizierter Siliciumwafer<\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>, J. Grobe, A. Benninghoven, B. Hagenhoff, K. Meier: Instrumentalized Analytical Chemistry and Computer Technology, Tagungsband InCom 1993.<\/p>\n<p><strong>Oberfl\u00e4chenuntersuchungen an Siliciumwafern<\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>, Diplomarbeit, M\u00fcnster (1991)<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21916\" class=\"elementor-tab-title\" data-tab=\"16\" role=\"button\" aria-controls=\"elementor-tab-content-21916\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Nanoanalytics \/ Technology<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21916\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"16\" role=\"region\" aria-labelledby=\"elementor-tab-title-21916\"><p><strong>Application of Laser Postionization Secondary Neutral Mass Spectrometry\/Time-of-Flight Secondary Ion Mass Spectrometry in Nanotoxicology: Visualization of Nanosilver in Human Macrophages and Cellular Responses<\/strong><br \/>A. Haase, H.F. Arlinghaus, J. Tentschert, H. Jungnickel, P. Graf, A. Mantion, F. Draude, <span style=\"text-decoration: underline;\">S. Galla<\/span>, J. Plendl, M.E. Goetz, A. Masic, W. Meier, A.F. Th\u00fcnemann, A. Taubert, A. Luch: ACS NANO, 5, 3059 \u2013 3068 (2011).<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1021\/nn200163w\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/nn200163w<\/a><\/p>\n<p><strong>ToF-SIMS and Laser-SNMS analysis of macrophages after exposure to silver nanoparticles<\/strong><br \/>F. Draude, <span style=\"text-decoration: underline;\">S. Galla<\/span>, S, A. Pelster , A. J. Tentschert, H. Jungnickel, A. Haase, A. Mantion, A. F. Th\u00fcnemann, A. Taubert, A. Luch, H. F. Arlinghaus: Surface and Interface Analysis, 45(1), 286\u2013289 (2013).<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1002\/sia.4902\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1002\/sia.4902<\/a><\/p>\n<p><strong>Im Dienst der Umwelt und der Wertsch\u00f6pfung<\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>: in Nanowelt M\u00fcnster, (2010), S. 75<\/p>\n<p><strong>In-Situ FT-IR Studies of Porous Silicon Surface Reactions <\/strong><br \/><span style=\"text-decoration: underline;\">R. Dietrich<\/span>, <span style=\"text-decoration: underline;\">H. Feld<\/span>, J. Grobe: J. Mol. Struct., 349, (1995), 109 \u2013 112<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1016\/0022-2860(95)08721-7\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1016\/0022-2860(95)08721-7<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21917\" class=\"elementor-tab-title\" data-tab=\"17\" role=\"button\" aria-controls=\"elementor-tab-content-21917\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Quaternary ammonium compounds<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21917\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"17\" role=\"region\" aria-labelledby=\"elementor-tab-title-21917\"><p><strong>Die unkontrollierte Verbreitung von quart\u00e4ren Ammoniumverbindungen (QAV) in Alltagsprodukten sowie in medizinischen und industriellen Bereichen \u2013 kritisch f\u00fcr Mensch, Material und Umwelt<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, <span style=\"text-decoration: underline;\">N. Oberender<\/span>: Hygiene und Medizin 43-5 (2018), D37-D45.<\/p>\n<p><strong>Problematische Verbreitung von quart\u00e4ren Ammoniumverbindungen in Alltagsprodukten<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>: Oberfl\u00e4chen Polysurfaces 5\/16 (2016), 6-11<br \/><a href=\"http:\/\/www.polymedia.ch\" target=\"_blank\" rel=\"noopener\">www.polymedia.ch<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21918\" class=\"elementor-tab-title\" data-tab=\"18\" role=\"button\" aria-controls=\"elementor-tab-content-21918\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Industrial practice<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21918\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"18\" role=\"region\" aria-labelledby=\"elementor-tab-title-21918\"><p><strong>Oberfl\u00e4chenanalytik in Nordrhein-Westfalen. Einsatzm\u00f6glichkeiten f\u00fcr die industrielle Praxis<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span> und <span style=\"text-decoration: underline;\">D. van Leyen<\/span>: Brosch\u00fcre Technologieland NRW, Hrsg. Ministerium f\u00fcr Wirtschaft und Mittelstand, Technologie und Verkehr des Landes NRW, 1. Auflage, 1994, 2. Auflage, 1997.<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21919\" class=\"elementor-tab-title\" data-tab=\"19\" role=\"button\" aria-controls=\"elementor-tab-content-21919\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Organometallic compounds<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21919\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"19\" role=\"region\" aria-labelledby=\"elementor-tab-title-21919\"><p><strong>Comparative Investigations of the Secondary Ion Emission of Metal Complexes under MeV- and keV Ion Bombardment<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, D. Rading, A. Leute, and A. Benninghoven: Organic Mass Spectrometry, 28 (1993) 841 \u2013 852.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1002\/oms.1210280805\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1002\/oms.1210280805<\/a><\/p>\n<p><strong>High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes \u2013 Crystal Structure of [Ni6(SC3H7)12] <\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, D. Rading, A. Leute, and A. Benninghoven; G. Henkel, T. Kr\u00fcger and B. Krebs: Zeitschrift f\u00fcr Naturforschung, Section B \u2013 A Journal of Chemical Sciences, 47 (1992) 929 \u2013 936.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1515\/znb-1992-0706\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1515\/znb-1992-0706<\/a><\/p>\n<p><strong>Novel application of Static SIMS and PDMS to coordination compounds. Part I: Metal complexes with a small number of metal centers<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, D. Rading, A. Leute, and A. Benninghoven; T. Kr\u00fcger, G. Reusmann, and B. Krebs: Secondary Ion Mass Spectrometry, SIMS VIII, p.25 \u2013 28; John Wiley &amp; Sons, Chichester 1992.<\/p>\n<p><strong>Novel application of Static SIMS and PDMS to coordination compounds. Part II: Ligand stabilized metal clusters <\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, D. Rading, A. Leute, and A. Benninghoven; G. Schmid: Secondary Ion Mass Spectrometry, SIMS VIII, p.29 \u2013 32; John Wiley &amp; Sons, Chichester 1992.<\/p>\n<p><strong>Analysis of ionic metal complexes by time-of-flight secondary ion mass spectrometry and plasma desorption mass spectrometry<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, A. Leute, D. Rading, and A. Benninghoven; G. Reusmann and B. Krebs: International Journal of Mass Spectrometry and Ion Processes, 110 (1991) 225 \u2013 235.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1016\/0168-1176(91)80030-Q\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1016\/0168-1176(91)80030-Q<\/a><\/p>\n<p><strong>Formation of Very Large Gold Superclusters (Clusters of Clusters) as Secondary Ions up to (Au13)55 by Secondary Ion Mass Spectrometry<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, A. Leute, D. Rading, and A. Benninghoven; G. Schmid: Journal of the American Chemical Society, 112 (1990) 8166 \u2013 8167.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1021\/ja00178a051\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/ja00178a051<\/a><\/p>\n<p><strong>Bericht \u00fcber die Entdeckung von (Au13)n \u2013 Superclustern<\/strong><br \/>durch <span style=\"text-decoration: underline;\">H. Feld<\/span>, A. Leute, D. Rading, A. Benninghoven, und G. Schmid: Nachr. Chem. Tech. Lab., 38 (1990) 1034.<\/p>\n<p><strong>Secondary ion mass spectra of gold super clusters up to 140000 Dalton <\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, A. Leute, D. Rading, and A. Benninghoven; G. Schmid: Zeitschrift f\u00fcr Physik D, 17 (1990) 73 \u2013 76<br \/><a href=\"https:\/\/doi.org\/10.1007\/BF01437501\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1007\/BF01437501<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21920\" class=\"elementor-tab-title\" data-tab=\"20\" role=\"button\" aria-controls=\"elementor-tab-content-21920\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Carbon clusters - Buckminsterfullerene<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21920\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"20\" role=\"region\" aria-labelledby=\"elementor-tab-title-21920\"><p><strong>Carbon Cluster Emission from Polymers under Kiloelectronvolt and Megaelectronvolt Ion Bombardment <\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, R. Zurm\u00fchlen, A. Leute, and A. Benninghoven: Journal of Physical Chemistry, 94 (1990) 4595 \u2013 4599.<br \/><a href=\"https:\/\/doi.org\/10.1021\/j100374a043\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1021\/j100374a043<\/a><\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21921\" class=\"elementor-tab-title\" data-tab=\"21\" role=\"button\" aria-controls=\"elementor-tab-content-21921\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Patent specifications<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21921\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"21\" role=\"region\" aria-labelledby=\"elementor-tab-title-21921\"><p><strong>Sensoren auf der Basis von Mikrostrukturen<\/strong><br \/>Erfinder: M. Knoll, <span style=\"text-decoration: underline;\">H. Feld<\/span>, S. Adam, und J. Eshold: Deutsches Patentamt und Markenamt, DE 4426507 (C2), Patenterteilung: 26.04.2001.<\/p>\n<p><strong>Verfahren zur Photoresistbeschichtung von mikromechanisch dreidimensional strukturierten Bauteilen in der Mikrostrukturtechnik sowie Vorrichtung zur Durchf\u00fchrung des Verfahrens<\/strong><br \/>Erfinder: <span style=\"text-decoration: underline;\">H. Feld<\/span>, C. Sundermeier, und M. Knoll: Deutsches Patentamt und Markenamt, DE 4228344 (A1), Patenterteilung: 10.06.1999<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-accordion-item\">\n\t\t\t\t\t<div id=\"elementor-tab-title-21922\" class=\"elementor-tab-title\" data-tab=\"22\" role=\"button\" aria-controls=\"elementor-tab-content-21922\" aria-expanded=\"false\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon elementor-accordion-icon-left\" aria-hidden=\"true\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-closed\"><i class=\"fas fa-plus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t<span class=\"elementor-accordion-icon-opened\"><i class=\"fas fa-minus\"><\/i><\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t\t<a class=\"elementor-accordion-title\" tabindex=\"0\">Development of analysis devices &amp; methods<\/a>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<div id=\"elementor-tab-content-21922\" class=\"elementor-tab-content elementor-clearfix\" data-tab=\"22\" role=\"region\" aria-labelledby=\"elementor-tab-title-21922\"><p><strong>Implementierung einer Bismut-Cluster-Prim\u00e4rionenquelle f\u00fcr analytische Anwendungen in der Laser-Sekund\u00e4rneutralteilchen \u2013 Massenspektrometrie<\/strong><br \/><span style=\"text-decoration: underline;\">S. Galla<\/span>, Dissertation, M\u00fcnster (2016).<\/p>\n<p><strong>Einfluss unterschiedlicher Laserparameter auf die Photoionisierung und Photofragmentierung von Carbons\u00e4uren in der Gasphase und nach Zerst\u00e4ubung von Ag-Oberfl\u00e4chen<\/strong><br \/><span style=\"text-decoration: underline;\">S. Galla<\/span>, Diplomarbeit, M\u00fcnster (2011).<\/p>\n<p><strong>Combined Instrument for the Online Investigation of Plasma-Deposited or Etched Surfaces by Monochromatized X-Ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry <\/strong><br \/><span style=\"text-decoration: underline;\">M. Deimel<\/span>, P.W. Jahn, F.M. Petrat, D. Wolany, T. Gantenfort, C. Schmerling, H. Wensing, L. Wiedmann, A. Benninghoven: J. Vac. Sci. Technol., A (1994), 12 (3), 671 \u2013 676.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1116\/1.578851\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1116\/1.578851<\/a><\/p>\n<p><strong>A Combined MXPS\/TOF-SIMS Instrument for the Investigation of Plasma-Deposited Polymeric Films<br \/><\/strong><span style=\"text-decoration: underline;\">M. Deimel<\/span>, P.W. Jahn, F.M. Petrat, C. Schmerling, D. Wolany, L. Wiedmann, A. Benninghoven: Secondary Ion Mass Spectrometry, SIMS VIII, p.593 \u2013 596, John Wiley &amp; Sons, Chichester 1992.<\/p>\n<p><strong>Sekund\u00e4rionenemission makromolekularer Festk\u00f6rper unter keV- und MeV-Ionenbeschuss: Entwicklung und Anwendung eines kombinierten Flugzeitmassen-spektrometers f\u00fcr die Untersuchung des keV- und MeV-ioneninduzierten Desorptionsprozesses<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, Dissertation, M\u00fcnster (1991)<\/p>\n<p><strong>Time-of-flight secondary ion mass spectrometry of insulators with pulsed charge compensation by lowenergy electrons<\/strong><br \/>B. Hagenhoff, <span style=\"text-decoration: underline;\">D. van Leyen<\/span>, E. Niehuis, A. Benninghoven: Journal of Vacuum Science &amp; Technology, A7(5) (1989) 3056 \u2013 3064.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1116\/1.576315\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1116\/1.576315<\/a><\/p>\n<p><strong>Design and performance of a reflectron based time \u2013 of \u2013 flight secondary ion mass spectrometer with electrodynamic primary ion mass separation<\/strong><br \/>E. Niehuis, T. Heller, <span style=\"text-decoration: underline;\">H. Feld<\/span>, A. Benninghoven: Journal of Vacuum Science &amp; Technology, A5(4) (1987) 1243 \u2013 1246.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1116\/1.574781\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1116\/1.574781<\/a><\/p>\n<p><strong>A New High Resolution Time-Of-Flight Secondary Ion Mass Spectrometer <\/strong><br \/>E. Niehuis, T. Heller, <span style=\"text-decoration: underline;\">H. Feld<\/span>, and A. Benninghoven: Abstr. 35th ASMS Conference on Mass Spectrometry and Allied Topics, p.296 \u2013 297; Denver (Colorado) 1987.<\/p>\n<p><strong>High-Resolution TOF Secondary Ion Mass Spectrometer <\/strong><br \/>E. Niehuis, T. Heller, <span style=\"text-decoration: underline;\">H. Feld<\/span>, and A. Benninghoven: Secondary Ion Mass Spectrometry SIMS V, p.188 \u2013 190; Springer Series in Chemical Physics, Volume 44; Springer, Berlin 1986.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1007\/978-3-642-82724-2_48\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1007\/978-3-642-82724-2_48<\/a><\/p>\n<p><strong>Development and performance of Time \u2013 Of \u2013 Flight Secondary Ion Mass Spectrometers <\/strong><br \/>E. Niehuis, T. Heller, <span style=\"text-decoration: underline;\">H. Feld<\/span>, and A. Benninghoven: Abstr. 34th ASMS Conference on Mass Spectrometry and Allied Topics, p.762 \u2013 763; Cincinnati (Ohio) 1986.<\/p>\n<p><strong>High\u2013Resolution TOF Secondary Ion Mass Spectrometer<\/strong><br \/>E. Niehuis, T. Heller, <span style=\"text-decoration: underline;\">H. Feld<\/span>, and A. Benninghoven: Ion Formation from Organic Solids (IFOS III),<br \/>p.198 \u2013 202; Springer Proceedings in Physics, Volume 9; Springer, Berlin 1986.<br \/>DOI: <a href=\"https:\/\/doi.org\/10.1007\/978-3-642-82718-1_37\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.1007\/978-3-642-82718-1_37<\/a><\/p>\n<p><strong>Aufbau und Erprobung eines Flugzeitmassenspektrometers f\u00fcr die Sekund\u00e4rionenmassenspektrometrie<\/strong><br \/><span style=\"text-decoration: underline;\">H. Feld<\/span>, Diplomarbeit, M\u00fcnster (1985)<\/p>\n<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Bibliography Publications with the participation of OFG analytics staff (Status 2024) Dr. Herbert Feld Dr. Dieter van Leyen Dr. Roger Dietrich Dr. Markus Deimel Dr. T.V. Phung Dr. Nadine Oberender Dipl.-Ing. J\u00f6rn Hellwig Dipl.-Chem. U. Scholten Dr. S. Galla Subject areas Areosol investigations Investigation of the Utility of Laser-Secondary Neutral Mass Spectrometry for the Detection [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"footnotes":""},"class_list":["post-3726","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.ofg-analytik.de\/en\/wp-json\/wp\/v2\/pages\/3726","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ofg-analytik.de\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.ofg-analytik.de\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.ofg-analytik.de\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ofg-analytik.de\/en\/wp-json\/wp\/v2\/comments?post=3726"}],"version-history":[{"count":4,"href":"https:\/\/www.ofg-analytik.de\/en\/wp-json\/wp\/v2\/pages\/3726\/revisions"}],"predecessor-version":[{"id":4035,"href":"https:\/\/www.ofg-analytik.de\/en\/wp-json\/wp\/v2\/pages\/3726\/revisions\/4035"}],"wp:attachment":[{"href":"https:\/\/www.ofg-analytik.de\/en\/wp-json\/wp\/v2\/media?parent=3726"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}