Analytical methods

OFG-Analytik uses all methods of analysis available today:

Surface analysis
Thin film analytics
Micro-range analysis

The selection of the optimum process or combination of processes is based exclusively on the customer’s individual requirements.

In combination with suitable sample preparation and our many years of experience in data analysis, we can provide you with all the relevant information on the chemical composition, layer structure and microstructure of your products and materials.

List of analytical procedures

TOF-SIMS
Time-of-flight secondary ion mass spectrometry

FTIR
Fourier transform infrared spectroscopy

XPS, ESCA
X-ray photoelectron spectroscopy

SNMS
Secondary neutral particle mass spectrometry

GDOS
Glow lamp emission spectral analysis

AFM
Atomic force microscopy

SEM / EDX
Scanning electron microscopy with
energy dispersive X-ray analysis

XRD
X-ray diffraction

Light microscopy

Further procedures on request

If necessary, further special variants of the procedures are used, supplemented by classic methods of materials testing, chemical analysis or physical measurement technology

Analytical information

What information do the procedures provide?

Modern surface and thin-layer analytical methods can image submicroscopically small sample areas and the smallest amounts of substances and analyze them with the highest sensitivity.

Depending on the issue at hand, we carry out investigations into:

Determination of the chemical composition

of any materials or component surfaces
of interfaces between poorly adhering layer areas
of organic trace contaminants
of functionally coated or pre-treated surfaces
of substances in the bulk material (material determination)
of deposits, coatings, efflorescence on component surfaces
of cracked surfaces

Material characterization and identification

Fats, oils, surfactants, release agents
Plastic/oil additives
Lacquer, paint, adhesive components
Plastics, polymers, biomolecules, pharmaceuticals
Aerosol particles (adsorbed on metal sheets)
Particles, fibers, inclusions

Determination of the layer structure of multilayer systems

Representation of the layer sequence in cross-section
Determination of the individual layer thicknesses
Determination of element composition as a function of layer depth (depth profile analysis)
Characterization of inclusions in the layer structure
Accumulation of foreign elements in the interfaces between individual layers

Representation of the topography and microstructure

Topography of any material/product surface
Determination of micro-roughness and roughness parameters
Imaging of microparticles, fibers
Representation of micro-/ nanostructured surfaces
Visualization of submicroscopically small defect areas