Failure and Damage Analysis
Despite high standards in quality assurance and quality control, failures or damage to products and components occur frequently in production chains. Failure and damage analysis is primarily used to identify the causes of such problems. In addition, it helps minimize failures along the value chain and optimize production processes in a targeted and effective way.
With over 30 years of experience in this field, we offer our customers a wide range of analytical support to investigate the root causes of specific problems. In addition to imaging techniques such as light microscopy, we utilize state-of-the-art surface and trace analysis methods (such as TOF-SIMS; Time-of-Flight Mass Spectrometry) to clearly identify the chemical causes of defects and damage.
This is complemented by extensive expertise gained through many years of handling a wide range of failure investigations across a variety of industries. This enables us to handle your request efficiently and effectively—from designing the analysis plan and conducting the analysis to identifying the root cause.
Despite high standards in quality assurance and quality control, failures or damage to products and components occur frequently in production chains. Failure and damage analysis is primarily used to identify the causes of such problems. In addition, it helps minimize failures along the value chain and optimize production processes in a targeted and effective way.
With over 30 years of experience in this field, we offer our customers a wide range of analytical support to investigate the root causes of specific problems. In addition to imaging techniques such as light microscopy, we utilize state-of-the-art surface and trace analysis methods (such as TOF-SIMS; Time-of-Flight Mass Spectrometry) to clearly identify the chemical causes of defects and damage.
This is complemented by extensive expertise gained through many years of handling a wide range of failure investigations across a variety of industries. This enables us to handle your request efficiently and effectively—from designing the analysis plan and conducting the analysis to identifying the root cause.
Current application examples in the field of failure and damage analysis
Click here for more application examples.
A selection of our methods:
- TOF-SIMS – Time-of-Flight mass spectrometry
- IR – Infrared Spectroscopy
- XPS – X-ray photoelectron spectroscopy
- REM – Rasterelektronenmikroskopie
- SEM – Scanning Electron Microscopy
- AFM – Atomic Force Microscopy
- Light microscopy
Here is an overview of other methods.
Please contact us directly or via our contact form for a personalized consultation.
